From e9f2a48f3e8df3af26a270341e9ed1e5b79eda68 Mon Sep 17 00:00:00 2001
From: 啊鑫 <t2856754968@163.com>
Date: 星期日, 11 五月 2025 18:15:06 +0800
Subject: [PATCH] 添加检验生成失败的补偿机制
---
src/main/resources/mapper/MesInvItemArnMapper.xml | 13 +++++++++++++
1 files changed, 13 insertions(+), 0 deletions(-)
diff --git a/src/main/resources/mapper/MesInvItemArnMapper.xml b/src/main/resources/mapper/MesInvItemArnMapper.xml
index 43a618c..5c29da2 100644
--- a/src/main/resources/mapper/MesInvItemArnMapper.xml
+++ b/src/main/resources/mapper/MesInvItemArnMapper.xml
@@ -4,4 +4,17 @@
"http://mybatis.org/dtd/mybatis-3-mapper.dtd">
<mapper namespace="com.gs.xky.mapper.MesInvItemArnMapper">
+ <select id="selectItemArnMinus" resultType="com.gs.xky.entity.MesInvItemArn">
+ select *
+ from mes_inv_item_arn
+ where BILL_NO in (select BILL_NO
+ from (select b.BILL_NO
+ from mes_inv_item_arn_detail a
+ left join mes_inv_item_arn b on a.mid = b.id
+ where a.check_states = '寰呮')
+ minus
+ select LOT_NO
+ from MES_QA_ITEMS_DETECT_01)
+ and FSTATUS = 1
+ </select>
</mapper>
--
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