From e9f2a48f3e8df3af26a270341e9ed1e5b79eda68 Mon Sep 17 00:00:00 2001
From: 啊鑫 <t2856754968@163.com>
Date: 星期日, 11 五月 2025 18:15:06 +0800
Subject: [PATCH] 添加检验生成失败的补偿机制
---
src/main/resources/mapper/MesInvItemArnDetailMapper.xml | 6 ++++++
1 files changed, 6 insertions(+), 0 deletions(-)
diff --git a/src/main/resources/mapper/MesInvItemArnDetailMapper.xml b/src/main/resources/mapper/MesInvItemArnDetailMapper.xml
index bad7565..48ea5e1 100644
--- a/src/main/resources/mapper/MesInvItemArnDetailMapper.xml
+++ b/src/main/resources/mapper/MesInvItemArnDetailMapper.xml
@@ -4,4 +4,10 @@
"http://mybatis.org/dtd/mybatis-3-mapper.dtd">
<mapper namespace="com.gs.xky.mapper.MesInvItemArnDetailMapper">
+ <select id="selectListByMid" resultType="com.gs.xky.entity.MesInvItemArnDetail">
+ SELECT EBELN, WORK_LINE, ITEM_NO, ITEM_ID, ID
+ FROM mes_inv_item_arn_detail
+ WHERE MID = #{mid}
+ GROUP BY EBELN, WORK_LINE, ITEM_NO, ITEM_ID, ID
+ </select>
</mapper>
--
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